Todays ASICs require innovative design techniques to reach the critical safety targets that medical and automotive customers demand. At ICsense, the digital design team successfully implements LBIST (Logic Built-In Self test) diagnosis which is able to detect random defects in the digital logic during normal operation of the ASIC. The LBIST function uses empty time slots of the DSP (Digital Signal Processing) sequence to inject patterns in the digital logic that are able to detect stuck-at faults. The achieved test coverage is 70-80% and is of great value to achieve the ASIL-B requirement in automotive ASIC developments. This work was presented by ICsense in the Synopsys User Group (SNUG) conference.

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